Measurement techniques for aspheric surface parameters
Qun Hao, Yiming Liu, Yao Hu, Xin Tao
Abstract
Aspheric surfaces are widely used in advanced optical instruments. Measuring the aspheric surface parameters (ASPs) with high accuracy is vital for manufacturing and aligning optical aspheric surfaces. This paper provides a review of various techniques for measuring ASPs and discusses the advantages/disadvantages of these approaches. The aim of this review is to contribute to advancements in the fabrication and testing of aspheric optical elements and their practical applications in diverse fields.
Topics & Concepts
Surface (topology)Computer scienceMaterials scienceOpticsGeometryMathematicsPhysicsOptical measurement and interference techniquesSurface Roughness and Optical MeasurementsAdvanced Measurement and Metrology Techniques