Standardizing flat lens characterization
Jacob Engelberg, Uriel Levy
Topics & Concepts
Lens (geology)NanophotonicsMacroComputer scienceOpticsCharacterization (materials science)Consistency (knowledge bases)Field (mathematics)Through-the-lens meteringPhysicsArtificial intelligenceMathematicsPure mathematicsProgramming languageOptical Coatings and GratingsAdvanced optical system designNear-Field Optical Microscopy