In situ investigation of nanometric cutting of 3C-SiC using scanning electron microscope
Dongyu Tian, Zongwei Xu, Lei Liu, Zhanqi Zhou, Junjie Zhang, Xuesen Zhao, Alexander Hartmaier, Bing Liu, Le Song, Xichun Luo
Topics & Concepts
Materials scienceScanning electron microscopeElectron backscatter diffractionBrittlenessMachiningTransmission electron microscopyMicroscopeCharacterization (materials science)In situComposite materialDiffractionDeformation (meteorology)MetallurgyNanotechnologyOpticsMicrostructureChemistryOrganic chemistryPhysicsAdvanced Surface Polishing TechniquesDiamond and Carbon-based Materials ResearchMetal and Thin Film Mechanics