Noise behavior of vertical tunnel FETs under the influence of interface trap states
Vandana Devi Wangkheirakpam, Brinda Bhowmick, Puspa Devi Pukhrambam
Topics & Concepts
Flicker noiseNoise (video)Burst noiseNoise generatorTrap (plumbing)Noise spectral densityInfrasoundShot noiseElectrical engineeringDiffusionAcousticsLow frequencyPhysicsPhase noiseNoise floorOptoelectronicsElectronic engineeringNoise measurementNoise figureEngineeringTelecommunicationsComputer scienceNoise reductionArtificial intelligenceImage (mathematics)DetectorCMOSThermodynamicsAmplifierMeteorologyAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis