Numerical Analysis of Localized Electric Field Enhancement in Apertureless Near Field Optical Microscopy
Ayushman Ramola, Amit Kumar Shakya, Yarden Mazor, Nezah Balal, Arik Bergman
Topics & Concepts
Materials scienceElectric fieldOpticsNear-field opticsNear-field scanning optical microscopeNear and far fieldOptical microscopeNumerical analysisMicroscopyOptoelectronicsOptical forceComputer simulationLight scatteringField (mathematics)Optical fieldOptical imagingTotal internal reflectionFinite element methodNumerical modelingPhysical opticsRigorous coupled-wave analysisOptical fiberEvanescent waveRefractive indexNumerical modelsNanophotonicsOptical materialsNear-Field Optical MicroscopyIntegrated Circuits and Semiconductor Failure AnalysisOptical Coatings and Gratings