Process evaluation in FinFET based 7T SRAM cell
T. Santosh Kumar, Suman Lata Tripathi
Topics & Concepts
Static random-access memoryDissipationTransistorElectronic engineeringProcess cornersData retentionProcess variationScalingVoltageLeakage (economics)Power (physics)Low-power electronicsElectrical engineeringLow voltageMaterials scienceEngineeringComputer sciencePhysicsMacroeconomicsThermodynamicsQuantum mechanicsMathematicsEconomicsGeometryPower consumptionAdvancements in Semiconductor Devices and Circuit DesignLow-power high-performance VLSI designSemiconductor materials and devices