Box plots: A simple graphical tool for visualizing overfitting in peak fitting as demonstrated with X-ray photoelectron spectroscopy data
Behnam Moeini, Hyrum Haack, Neal Fairley, Vincent Fernandez, Thomas R. Gengenbach, Christopher D. Easton, Matthew R. Linford
Topics & Concepts
Maxima and minimaOverfittingMonte Carlo methodPlot (graphics)Computer scienceScatter plotAlgorithmStatistical physicsMathematicsStatisticsArtificial intelligencePhysicsArtificial neural networkMathematical analysisElectron and X-Ray Spectroscopy TechniquesMachine Learning in Materials ScienceX-ray Spectroscopy and Fluorescence Analysis