Spectroscopic ellipsometry and morphological studies of nanocrystalline NiO and NiO/ITO thin films deposited by e-beams technique
M. Emam-Ismail, M. El-Hagary, Hesham El‐Sherif, A. M. El‐naggar, M.M. El-Nahass
Topics & Concepts
Non-blocking I/OMaterials scienceNanocrystalline materialSubstrate (aquarium)Thin filmCrystalliteEllipsometryAnalytical Chemistry (journal)NanotechnologyMetallurgyChemistryBiochemistryOceanographyCatalysisChromatographyGeologyTransition Metal Oxide NanomaterialsZnO doping and propertiesGa2O3 and related materials