Dimensional artefacts to achieve metrological traceability in advanced manufacturing
Simone Carmignato, Leonardo De Chiffre, Harald Bosse, Richard Leach, Alessandro Balsamo, William T. Estler
Topics & Concepts
TraceabilityMetrologyContext (archaeology)Manufacturing engineeringProduction (economics)ProductivityQuality (philosophy)Systems engineeringEngineeringComputer scienceDigital manufacturingProcess engineeringSoftware engineeringMathematicsEpistemologyMacroeconomicsPaleontologyBiologyPhilosophyStatisticsEconomicsAdvanced Measurement and Metrology TechniquesIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical Measurements