A dynamic data driven reliability prognosis method for structural digital twin and experimental validation
Yumei Ye, Qiang Yang, Jingang Zhang, Songhe Meng, Jun Wang
Topics & Concepts
Reliability (semiconductor)Structural health monitoringReliability engineeringVibrationBayesian inferenceComputer scienceStructural systemReduction (mathematics)EngineeringStructural engineeringBayesian probabilityArtificial intelligencePhysicsGeometryQuantum mechanicsPower (physics)MathematicsStructural Health Monitoring TechniquesNon-Destructive Testing TechniquesMachine Fault Diagnosis Techniques