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The internal modified layer structure of silicon carbide induced by ultrafast laser and its application in stealth dicing

Xiaozhu Xie, Tao Liu, Kaijun Lv, Yaoan Huang, Yajun Huang, Wei Hu, Jiangyou Long

2024Precision Engineering22 citationsDOI

Topics & Concepts

Wafer dicingWaferMaterials scienceSilicon carbideLaserLayer (electronics)Surface roughnessSurface finishComposite materialSiliconEnhanced Data Rates for GSM EvolutionCarbideOptoelectronicsOpticsPhysicsTelecommunicationsComputer scienceAdvanced Surface Polishing TechniquesLaser Material Processing TechniquesDiamond and Carbon-based Materials Research
The internal modified layer structure of silicon carbide induced by ultrafast laser and its application in stealth dicing | Litcius