Ultrafast microstructure modification by pulsed electron beam to enhance surface performance
Yanfei Geng, Xizhang Chen, С. В. Коновалов, И. А. Панченко, Yu. F. Ivanov, V. B. Deev, E. S. Prusov
Topics & Concepts
Materials scienceMicrostructureDislocationMisorientationComposite materialTransmission electron microscopyScanning electron microscopeIrradiationSurface layerAnalytical Chemistry (journal)Layer (electronics)NanotechnologyGrain boundaryChromatographyPhysicsChemistryNuclear physicsPulsed Power Technology ApplicationsIntegrated Circuits and Semiconductor Failure AnalysisIon-surface interactions and analysis