Litcius/Paper detail

EDDs: A series of Efficient Defect Detectors for fabric quality inspection

Tong Zhou, Jiabin Zhang, Hu Su, Wei Zou, Bohao Zhang

2020Measurement40 citationsDOI

Topics & Concepts

Convolutional neural networkFeature (linguistics)Computer scienceDetectorFLOPSPyramid (geometry)Artificial intelligencePattern recognition (psychology)Point (geometry)Reduction (mathematics)Computer visionMathematicsTelecommunicationsParallel computingLinguisticsGeometryPhilosophyIndustrial Vision Systems and Defect DetectionImage Processing Techniques and ApplicationsOptical measurement and interference techniques
EDDs: A series of Efficient Defect Detectors for fabric quality inspection | Litcius