Improved depth characterization of internal defect using the fusion of shearography and speckle interferometry
Guoqing Gu, Yun Pan, Chengchun Qiu, Chengjie Zhu
Topics & Concepts
ShearographySpeckle patternNondestructive testingMaterials scienceOpticsCharacterization (materials science)InterferometrySpeckle imagingFusionElectronic speckle pattern interferometryPhysicsPhilosophyLinguisticsQuantum mechanicsOptical measurement and interference techniquesThermography and Photoacoustic TechniquesStructural Health Monitoring Techniques