Origin of Incremental Step Pulse Programming (ISPP) slope degradation in charge trap nitride based multi-layer 3D NAND flash
Kihoon Nam, Chanyang Park, Jun-Sik Yoon, Hyundong Jang, Min Sang Park, Jaesung Sim, Rock‐Hyun Baek
Topics & Concepts
Trap (plumbing)NAND gateFlash (photography)Degradation (telecommunications)Data retentionFlash memoryMaterials scienceOptoelectronicsNitrideCharge trap flashPulse (music)Computer scienceElectronic engineeringLayer (electronics)Electrical engineeringComputer hardwareLogic gateOpticsEnvironmental sciencePhysicsNanotechnologyEngineeringAlgorithmVoltageEnvironmental engineeringSemiconductor materials and devicesAdvanced Data Storage TechnologiesAdvancements in Semiconductor Devices and Circuit Design