Evolution of the Electronic Properties of ZrX<sub>2</sub> (X = S, Se, or Te) Thin Films under Varying Thickness
Rovi Angelo B. Villaos, Harvey N. Cruzado, John Symon C. Dizon, Aniceto B. Maghirang, Zhi-Quan Huang, Chia-Hsiu Hsu, Shin-Ming Huang, Hsin Lin, Feng‐Chuan Chuang
Abstract
Probing the effects of thin-film thickness on transition metal dichalcogenides offer novel insights into their electronic properties and tunability, which leads to a new avenue of research and applications. A comprehensive first-principles study on thickness-dependent structural stabilities and electronic properties of ZrX2 (X = S, Se, or Te) thin films from 1 layer (L) to 6L and bulk was performed. The calculated formation energies show that ZrX2 adopts the 1T phase as the most stable structure. Furthermore, 1T-ZrS2 and ZrSe2 thin films and bulk are indirect semiconductors and their band gaps decrease as the number of layers is increased up to 6L, while 1T-ZrTe2 thin films and bulk are semimetallic. Interestingly, we demonstrate that the surface band structure of bulk and monolayer ZrTe2 under generalized gradient approximation + U and HSE06 methods is in excellent agreement with the angle-resolved photoelectron spectroscopy measurement. Finally, we discover the existence of van Hove singularities in strained 2L and unstrained 3L 1T-ZrS2 thin films, implying the existence of superconductivity in these thin films. These results showcase the tunable electronic properties of ZrX2 thin films because of thickness dependence and strain.