On-machine profile measurement of a micro cutting edge by using a contact-type compact probe unit
Bo Wen, Yuki Shimizu, Yu Watanabe, Hiraku Matsukuma, Wei Gao
Topics & Concepts
StylusDisplacement (psychology)Enhanced Data Rates for GSM EvolutionSystem of measurementAcousticsOpticsAccuracy and precisionMachine toolMeasuring principleMicroscopeProfilometerMaterials scienceEngineeringMechanical engineeringComputer scienceComputer visionSurface finishPhysicsPsychotherapistQuantum mechanicsAstronomyPsychologyAdvanced Measurement and Metrology TechniquesSurface Roughness and Optical MeasurementsAdhesion, Friction, and Surface Interactions