High-Throughput High-Resolution Digital Image Correlation Measurements by Multi-Beam SEM Imaging
R. L. Black, Tomasz Garbowski, C. Bean, Anna Lena Eberle, S. Nickell, Damien Texier, V. Vallé, Jean‐Charles Stinville
Topics & Concepts
Digital image correlationSlip (aerodynamics)Materials scienceSolid mechanicsImage resolutionOpticsArtificial intelligenceComputer sciencePhysicsComposite materialThermodynamicsIntegrated Circuits and Semiconductor Failure AnalysisForce Microscopy Techniques and ApplicationsAdvanced Electron Microscopy Techniques and Applications