Litcius/Paper detail

Design of low power, variation tolerant single bitline 9T SRAM cell in 16-nm technology in subthreshold region

Chandramauleshwar Roy, Aminul Islam

2021Microelectronics Reliability34 citationsDOI

Topics & Concepts

Static random-access memoryTransistorComputer scienceCacheProcess variationElectronic engineeringDynamic demandVoltageSubthreshold conductionNode (physics)Power (physics)Electrical engineeringEngineeringParallel computingPhysicsStructural engineeringQuantum mechanicsLow-power high-performance VLSI designAdvancements in Battery MaterialsAdvanced Memory and Neural Computing