Scanning thermal microscopy method for thermal conductivity measurement of a single SiO2 nanoparticle
Wencan Chen, Yanhui Feng, Lin Qiu, Xinxin Zhang
Topics & Concepts
Scanning thermal microscopyThermal conductivityMaterials scienceNanoparticleThermal conductivity measurementNanomaterialsThermalThermal contact conductanceMicroscopyResolution (logic)CalibrationAnalytical Chemistry (journal)Thermal resistanceNanotechnologyComposite materialOpticsChemistryThermodynamicsChromatographyComputer sciencePhysicsQuantum mechanicsArtificial intelligenceThermal properties of materialsThermal Radiation and Cooling TechnologiesAdvanced Thermoelectric Materials and Devices