Analog Circuit Fault Diagnosis Using a Novel Variant of a Convolutional Neural Network
Liang Han, Feng Liu, Kaifeng Chen
Abstract
Analog circuits play an important role in modern electronic systems. Aiming to accurately diagnose the faults of analog circuits, this paper proposes a novel variant of a convolutional neural network, namely, a multi-scale convolutional neural network with a selective kernel (MSCNN-SK). In MSCNN-SK, a multi-scale average difference layer is developed to compute multi-scale average difference sequences, and then these sequences are taken as the input of the model, which enables it to mine potential fault characteristics. In addition, a dynamic convolution kernel selection mechanism is introduced to adaptively adjust the receptive field, so that the feature extraction ability of MSCNN-SK is enhanced. Based on two well-known fault diagnosis circuits, comparison experiments are conducted, and experimental results show that our proposed method achieves higher performance.