Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review

Ananthu Prasad, Nisa V. Salim, Miran Mozetič, Lekshmi Kailas, Sabu Thomas

2022Journal of Applied Polymer Science23 citationsDOI Open Access PDF

Abstract

Abstract Time of flight‐secondary ion mass spectrometry (ToF‐SIMS) is a SIMS based surface sensitive technique that provide specific compound identification of surface molecules. Recently, the importance of ToF‐SIMS has grown for the characterization and utilization of polymers, pharmaceuticals, semi‐conductors. The compound specificity of ToF‐SIMS distinguishes it from other surface characterization techniques such as X‐ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and so forth, making it a preferred tool for the effective surface analysis of polymers. The purpose of this review is to elucidate the capability of ToF‐SIMS technique to effectively analyze the surface chemistry of polymer materials.

Topics & Concepts

Secondary ion mass spectrometryX-ray photoelectron spectroscopyTime of flightCharacterization (materials science)Static secondary-ion mass spectrometryPolymerAuger electron spectroscopyMass spectrometryAnalytical Chemistry (journal)Materials scienceElectron spectroscopyIonPolymer characterizationChemistrySecondary Ion Mass SpectroscopyMoleculeNanotechnologyChemical engineeringOrganic chemistryChromatographyTransmission electron microscopyScanning transmission electron microscopySiliconPhysicsEnergy filtered transmission electron microscopyEngineeringNuclear physicsIon-surface interactions and analysisAnalytical chemistry methods developmentMass Spectrometry Techniques and Applications