Application of optimal clustering and metric learning to patch-based anomaly detection
Jae‐Young Ahn, Gyeonghwan Kim
Topics & Concepts
Cluster analysisComputer scienceAnomaly detectionMetric (unit)Artificial intelligenceInferencePattern recognition (psychology)AutoencoderData miningSet (abstract data type)Machine learningDeep learningEconomicsOperations managementProgramming languageAnomaly Detection Techniques and ApplicationsData-Driven Disease SurveillanceCOVID-19 diagnosis using AI