Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets
Reza Ramezani, Juan Antonio Clemente, Francisco J. Franco
Topics & Concepts
Static random-access memoryReliability (semiconductor)Field-programmable gate arrayReliability engineeringSoft errorComputer scienceEmbedded systemInterval (graph theory)Mean time between failuresFailure rateComputer engineeringComputer hardwareElectronic engineeringEngineeringPower (physics)MathematicsCombinatoricsPhysicsQuantum mechanicsRadiation Effects in ElectronicsReliability and Maintenance OptimizationVLSI and Analog Circuit Testing