Thickness‐Dependent Superconductivity in a Layered Electride on Silicon
Dmitry V. Averyanov, Ivan S. Sokolov, Oleg E. Parfenov, Alexander N. Taldenkov, Igor A. Karateev, Oleg A. Kondratev, Andrey M. Tokmachev, Vyacheslav G. Storchak
Abstract
Abstract Layered materials exhibit a plethora of fascinating properties. The challenge is to make the materials into epitaxial films, preferably integrated with mature technological platforms to facilitate their potential applications. Progress in this direction can establish the film thickness as a valuable parameter to control various phenomena, superconductivity in particular. Here, a synthetic route to epitaxial films of SrAlSi, a layered superconducting electride, on silicon is designed. A set of films ranging in thickness is synthesized employing a silicene‐based template. Their structure and superconductivity are explored by a combination of techniques. Two regimes of T C dependence on the film thickness are identified, the coherence length being the crossover parameter. The results can be extended to syntheses of other honeycomb‐lattice ternary compounds on Si or Ge exhibiting superconducting, magnetic, and other properties.