Synthesis and characterization of Cu<sub>3</sub>SbS<sub>4</sub> thin films grown by co-sputtering metal precursors and subsequent sulfurization
A. Azizur Rahman, Emroj Hossian, Hetal Vaishnav, Jayesh B. Parmar, Arnab Bhattacharya, Arun Sarma
Abstract
X-ray diffraction profile, Raman and optical absorption spectra, and surface morphology of phase-pure Cu<sub>3</sub>SbS<sub>4</sub> films grown at 425 °C by co-sputtering metal precursors and subsequent sulfurization.
Topics & Concepts
SputteringCharacterization (materials science)Materials scienceThin filmMetalMetallurgyNanotechnologyChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesAdvanced Thermoelectric Materials and Devices