Deformation measurement in Al thin films at elevated temperatures by digital image correlation with speckles prepared by femtosecond laser
Zhiwen Chen, Guoliang Xu, Qiang Cao, Meng Ruan, Sheng Liu, Huiming Pan, Li Liu
Topics & Concepts
Speckle patternMaterials scienceOpticsLaserDigital image correlationMicroelectronicsDeformation (meteorology)Thin filmWhite light interferometryFemtosecondInterferometryOptoelectronicsComposite materialNanotechnologyPhysicsOptical measurement and interference techniquesLaser Material Processing TechniquesSurface Roughness and Optical Measurements