Grazing Emission X‐Ray Fluorescence: Novel Concepts and Applications for Nano‐Analytics
Jonas Baumann, Yves Kayser, Birgit Kanngießer
Abstract
Angle‐resolved X‐ray fluorescence spectroscopy gives access to elemental analysis of nanoscaled materials. The two main techniques of this method are grazing incidence X‐ray fluorescence (GIXRF) and grazing emission X‐ray fluorescence (GEXRF) spectroscopy. Principles of both techniques including main applications are discussed in this Review. The main focus lies on the description of GEXRF technique and its new analytical possibilities in the nano‐world.
Topics & Concepts
FluorescenceFluorescence spectroscopyNano-X-ray fluorescenceSpectroscopyFluorescence cross-correlation spectroscopyGrazingMaterials scienceAnalytical Chemistry (journal)Focus (optics)NanotechnologyOpticsChemistryPhysicsEnvironmental chemistryEcologyAstronomyComposite materialBiologyX-ray Spectroscopy and Fluorescence AnalysisAdvanced X-ray Imaging TechniquesX-ray Diffraction in Crystallography