Electronic properties and defect levels induced by <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" id="d1e1065" altimg="si112.svg"> <mml:mrow> <mml:mi>n</mml:mi> <mml:mo>/</mml:mo> <mml:mi>p</mml:mi> </mml:mrow> </mml:math> -type defect-complexes in Ge

E. Igumbor, O. Olaniyan, G.M. Dongho-Nguimdo, R.E. Mapasha, Sohail Ahmad, E. Omotoso, W.E. Meyer