Impact of Temperature on the Reliability of UTB-DG-FE-TFETs and Their RF/Analog and Linearity Parameter Dependence
Girdhar Gopal, Tarun Varma
Topics & Concepts
IntermodulationLinearityFigure of meritMaterials scienceOptoelectronicsTransistorReliability (semiconductor)VoltagePower (physics)Electrical engineeringElectronic engineeringComputer sciencePhysicsAmplifierEngineeringCMOSQuantum mechanicsAdvancements in Semiconductor Devices and Circuit DesignFerroelectric and Negative Capacitance DevicesSemiconductor materials and devices