Scanning probe microscopy
Ke Bian, Christoph Gerber, Andreas J. Heinrich, Daniel J. Müller, Simon Scheuring, Ying Jiang
Topics & Concepts
Scanning probe microscopyNanotechnologyMicroscopyScanning tunneling microscopeScanning capacitance microscopyScanning ion-conductance microscopyAtomic force microscopyNanoscopic scaleMaterials sciencePhysicsOpticsScanning confocal electron microscopyForce Microscopy Techniques and ApplicationsSurface and Thin Film PhenomenaMolecular Junctions and Nanostructures