A Review of Nanoparticles Characterization Techniques
Pankaj Wadhwa, Supriya Sharma, Sanjeev Kumar Sahu, Ajit Sharma, Deepak Kumar
Abstract
Abstract: Nanoparticles (NPs) are small materials of sizes 1 to 100 nm and can be divided into different categories according to their properties, shapes, or sizes. They can be classified as metal nanoparticles, carbon-based nanoparticles, semiconductor nanoparticles, ceramics nanoparticles, polymeric nanoparticles, and lipid-based nanoparticles. The basic characteristics used while characterizing the nanoparticles are morphology, size, surface charge, and optical properties. SEM, environmental SEM (ESEM), tip-enhanced Raman spectroscopy (TERS), scanning tunneling microscopy (STM), and TEM are used to study the topography and morphology of nanoparticles. Spectral analysis is employed to check optical properties, while X-ray crystallography (XRD), energy-dispersive X-ray (EDX) spectroscopy, Fourier transform infrared spectroscopy (FTIR), and fluorescence correlation spectroscopy (FCS) are used for learning the fundamental properties of nanoparticles (NPs). This review will focus on the utilization of these techniques in the characterization of nanoparticles.