Novel binary addition tree algorithm (BAT) for calculating the direct lower-bound of the highly reliable binary-state network reliability
Wei‐Chang Yeh, Shi-Yi Tan, Wenbo Zhu, Chia‐Ling Huang, Guang-yi Yang
Topics & Concepts
Reliability (semiconductor)Computer scienceBinary numberMetric (unit)AlgorithmUpper and lower boundsState (computer science)Wireless sensor networkTheoretical computer scienceMathematicsComputer networkEngineeringMathematical analysisOperations managementPhysicsQuantum mechanicsArithmeticPower (physics)Reliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research