Investigation of morphology and texture properties of WSi2 coatings on W substrate based on contact-mode AFM and EBSD
Yingyi Zhang, Kunkun Cui, Qiangjian Gao, Shahid Hussain, Yan Lv
Topics & Concepts
Materials scienceElectron backscatter diffractionScanning electron microscopeSurface roughnessSubstrate (aquarium)Surface finishComposite materialTexture (cosmology)Energy-dispersive X-ray spectroscopyCoatingMetallurgyMicrostructureOceanographyComputer scienceImage (mathematics)Artificial intelligenceGeologyMetal and Thin Film MechanicsSemiconductor materials and interfacesCopper Interconnects and Reliability