Fast and accurate wheat grain quality detection based on improved YOLOv5
Wenyi Zhao, Shiyuan Liu, Xinyi Li, Xi Han, Huihua Yang
Topics & Concepts
Benchmark (surveying)Computer scienceArtificial intelligencePruningMachine learningInferenceOverhead (engineering)Feature extractionArtificial neural networkObject detectionData miningPattern recognition (psychology)BiologyGeodesyOperating systemAgronomyGeographyIndustrial Vision Systems and Defect DetectionSmart Agriculture and AIAdvanced Neural Network Applications