A review on radiation‐hardened memory cells for space and terrestrial applications
Mukku Pavan Kumar, Rohit Lorenzo
Abstract
Summary Over the past four decades, single event upset (SEU) and single event multiple node upset (SEMNU) have become the major issues in the memory area. Moreover, these upsets are prone to reliability issues in space, terrestrial, military, and medical applications. This article concisely reviews different researchers and academicians who proposed resilience techniques and methods to mitigate this upset mess. In addition, we also investigated the importance of and the impact of on device scaling parameters in upset mechanism, probability of memory failure, and the figure of metrics for the stability of memory cells.
Topics & Concepts
UpsetSingle event upsetReliability (semiconductor)Node (physics)Computer scienceReliability engineeringEvent (particle physics)Resilience (materials science)Space (punctuation)Static random-access memoryEngineeringPhysicsComputer hardwareOperating systemMechanical engineeringAstrophysicsQuantum mechanicsThermodynamicsPower (physics)Structural engineeringRadiation Effects in ElectronicsSemiconductor materials and devicesAdvanced Memory and Neural Computing