Research progress on the application of ceria nanoparticles as abrasives in dielectric layer CMP and post cleaning: Structure, morphology, doping, and mechanism
Xinyu Han, Renhao Liu, Baimei Tan, Fangyuan Wang, Yan Mei, Xinyu Zhao, Jiadong Zhao
Topics & Concepts
Cerium oxideMaterials scienceChemical-mechanical planarizationCeriumChemical engineeringSurface modificationShallow trench isolationAdsorptionSilicon dioxideOxideParticle sizeDopingNanotechnologyLayer (electronics)MetallurgyChemistryOptoelectronicsTrenchOrganic chemistryEngineeringAdvanced Surface Polishing TechniquesDiamond and Carbon-based Materials ResearchAdvanced materials and composites