Efficient Bayesian reliability assessment for step-stress accelerated Wiener degradation model
Shirong Zhou, Yincai Tang, Ancha Xu, Xinze Lian, Chunling Luo
Topics & Concepts
Reliability (semiconductor)Reliability engineeringBayesian probabilityDegradation (telecommunications)Stress (linguistics)Computer scienceEngineeringEnvironmental scienceStatisticsMathematicsPhilosophyPhysicsQuantum mechanicsPower (physics)TelecommunicationsLinguisticsReliability and Maintenance OptimizationProbabilistic and Robust Engineering DesignStatistical Distribution Estimation and Applications