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Quality-related fault detection for dynamic process based on quality-driven long short-term memory network and autoencoder

Yishun Liu, Keke Huang, Benedict Jun, Ke Wei, Yuxuan Li, Chunhua Yang, Weihua Gui

2024Neural Networks14 citationsDOI

Topics & Concepts

AutoencoderComputer scienceTerm (time)Quality (philosophy)Process (computing)Artificial intelligenceFault detection and isolationLong short term memoryFault (geology)Pattern recognition (psychology)Artificial neural networkReliability engineeringRecurrent neural networkEngineeringEpistemologyQuantum mechanicsPhysicsPhilosophyOperating systemActuatorGeologySeismologyFault Detection and Control SystemsAdvanced Data Processing TechniquesMineral Processing and Grinding
Quality-related fault detection for dynamic process based on quality-driven long short-term memory network and autoencoder | Litcius