Evolutionary computation-based reliability quantification and its application in big data analysis on semiconductor manufacturing
Qiao Xu, Naigong Yu, Mohammad Mehedi Hasan
Topics & Concepts
Reliability (semiconductor)Computer scienceUncertainty quantificationSemiconductor device fabricationMonte Carlo methodIdentification (biology)Reliability engineeringProcess (computing)Big dataData miningArtificial intelligenceWaferMachine learningMathematicsEngineeringStatisticsBiologyPower (physics)BotanyElectrical engineeringOperating systemPhysicsQuantum mechanicsIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisManufacturing Process and Optimization