Subspace benchmarking high-fidelity entangling operations with trapped ions
C. H. Baldwin, B. J. Bjork, J. P. Gaebler, D. Hayes, D. Stack
Abstract
The authors propose and demonstrate a new method for measuring the quality of an entangling operations in trapped-ion quantum computers. They use the method to tune up an entangling operation rivaling current world-record error rates, while providing a fidelity characterization for a gate of this quality.
Topics & Concepts
Subspace topologyPhysicsComputer scienceAlgorithmMeasure (data warehouse)Quality (philosophy)BenchmarkingIonDimension (graph theory)FidelityQuantum computerElectronic engineeringQuantumNoise (video)SigmaCharacterization (materials science)Quantum systemSpectrum (functional analysis)Quantum mechanicsQuantum gateError detection and correctionCurrent (fluid)Quantum Information and CryptographyQuantum Computing Algorithms and ArchitectureQuantum and electron transport phenomena