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Characterization of Epitaxial β-(Al,Ga,In)2O3-Based Films and Applications as UV Photodetectors

Luke A. M. Lyle, Serdal Okur, Venkata S. N. Chava, Mathew L. Kelley, R. F. Davis, Gary S. Tompa, M. V. S. Chandrashekhar, Andrew B. Greytak, Lisa M. Porter

2020Journal of Electronic Materials23 citationsDOI

Topics & Concepts

PhotocurrentX-ray photoelectron spectroscopyMaterials scienceSchottky diodeEpitaxySchottky barrierOptoelectronicsPhotoconductivityBand gapPhotodetectorMetalorganic vapour phase epitaxyNanocrystalline materialAnalytical Chemistry (journal)Thin filmSpectroscopyChemical vapor depositionChemistryNanotechnologyDiodePhysicsLayer (electronics)ChromatographyNuclear magnetic resonanceQuantum mechanicsGa2O3 and related materialsZnO doping and propertiesAdvanced Photocatalysis Techniques
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