Depth-resolved Laue microdiffraction with coded apertures
Doğa Gürsoy, Dina Sheyfer, Michael Wojcik, Wenjun Liu, Jonathan Z. Tischler
Abstract
A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X-ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub-micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented.
Topics & Concepts
OpticsDiffractionAperture (computer memory)X-ray crystallographyMaterials scienceResolution (logic)Coded apertureIterative reconstructionBroadbandPhysicsComputer scienceDetectorComputer visionArtificial intelligenceAcousticsAdvanced X-ray Imaging TechniquesNuclear Physics and ApplicationsMedical Imaging Techniques and Applications