Litcius/Paper detail

Research on the Application of Random Forest-based Feature Selection Algorithm in Data Mining Experiments

Huan Wang

2023International Journal of Advanced Computer Science and Applications20 citationsDOIOpen Access PDF

Abstract

Handling high-dimensional big data presents substantial challenges for Machine Learning (ML) algorithms, mainly due to the curse of dimensionality that leads to computational inefficiencies and increased risk of overfitting. Various dimensionality reduction and Feature Selection (FS) techniques have been developed to alleviate these challenges. Random Forest (RF), a widely-used Ensemble Learning Method (ELM), is recognized for its high accuracy and robustness, including its lesser-known capability for effective FS. While specialized RF models are designed for FS, they often struggle with computational efficiency on large datasets. Addressing these challenges, this study proposes a novel Feature Selection Model (FSM) integrated with data reduction techniques, termed Dynamic Correlated Regularized Random Forest (DCRRF). The architecture operates in four phases: Preprocessing, Feature Reduction (FR) using Best-First Search with Rough Set Theory (BFS-RST), FS through DCRRF, and feature efficacy assessment using a Support Vector Machine (SVM) classifier. Benchmarked against four gene expression datasets, the proposed model outperforms existing RF-based methods in computational efficiency and classification accuracy. This study introduces a robust and efficient approach to feature selection in high-dimensional big-data scenarios.

Topics & Concepts

OverfittingRandom forestComputer scienceFeature selectionDimensionality reductionSupport vector machineMachine learningArtificial intelligencePreprocessorData miningRobustness (evolution)Data pre-processingBig dataCurse of dimensionalityFeature (linguistics)AlgorithmPattern recognition (psychology)Artificial neural networkGeneChemistryLinguisticsBiochemistryPhilosophyMachine Learning and Data ClassificationMachine Learning and ELMFault Detection and Control Systems