Three-dimensional adaptive optical nanoscopy for thick specimen imaging at sub-50-nm resolution
Xiang Hao, Edward S. Allgeyer, Dong‐Ryoung Lee, Jacopo Antonello, Katherine Watters, Julianne A. Gerdes, Lena K. Schroeder, Francesca Bottanelli, Jiaxi Zhao, P. Kidd, Mark D. Lessard, James E. Rothman, Lynn Cooley, Thomas Biederer, Martin J. Booth, Joerg Bewersdorf
Topics & Concepts
Resolution (logic)OpticsAdaptive opticsMicroscopyImage resolutionDiffractionOptical microscopeFluorescenceMicroscopeMaterials scienceIsotropySTED microscopyFluorescence microscopeSuper-resolution microscopyPhysicsStimulated emissionComputer scienceScanning electron microscopeLaserArtificial intelligenceAdvanced Fluorescence Microscopy TechniquesNear-Field Optical MicroscopyAdvanced Electron Microscopy Techniques and Applications