Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study
Wenhan Fu, Chen–Fu Chien, Lizhen Tang
Topics & Concepts
TroubleshootingFault (geology)EngineeringReliability engineeringInterface (matter)Integrated circuitProcess (computing)Semiconductor device fabricationFault detection and isolationSIGNAL (programming language)Electronic engineeringComputer scienceReal-time computingEmbedded systemElectrical engineeringChemical engineeringActuatorOperating systemSeismologyGibbs isothermProgramming languagePulmonary surfactantGeologyWaferFault Detection and Control SystemsIndustrial Vision Systems and Defect DetectionMachine Learning and Data Classification