Dielectric properties of <scp>PMMA</scp>/<scp>KCTO</scp>(H) composites for electronics components
María Vikulova, Alexey Tsyganov, Alexey M. Bainyashev, Denis Artyukhov, Alexander Gorokhovsky, Dmitry S. Muratov, Nikolay Gorshkov
Abstract
Abstract Polymethyl methacrylate/hollandite‐like copper doped potassium titanate high‐k ceramics composites with different filler content (20–60 vol.%) are prepared by simple method of mixing of the polymer solution and ceramics dispersion followed evaporation of the solvent and hot pressing. The particle morphology and size are estimated by SEM. The composites obtained are studied by XRD, FTIR, and TGA methods. The influence of the additive and the concentration of hollandite‐like copper doped potassium titanate high‐k ceramics on dielectric properties (permittivity, conductivity, dielectric loss tangent) are investigated at frequency range from 10 −1 to 10 6 Hz. It is shown that the increasing of ceramics concentration cause the increasing of main dielectric characteristics, namely permittivity up to 40 and dielectric loss up to 0.13 at 60 vol.% of filler and 0.1 Hz. Conductivity percolation threshold for PMMA/KCTO(H) composites was estimated ( v c = 0.0773 vol. [20.9 wt. %]). Experimental data on permittivity are compared with different theoretical models (Lichtenecker's model and the Effective Medium Theory model).