Litcius/Paper detail

On the Accurate Full Characterization of Septum Polarizers Through Simple Amplitude Measurements in Back-to-Back Configuration

Juan Luis Cano, A. Mediavilla

2020IEEE Transactions on Microwave Theory and Techniques24 citationsDOI

Abstract

This article introduces an easy and accurate technique for the full characterization of septum polarizers (SPs) in back-to-back configuration through standard amplitude/power measurements at the rectangular waveguide ports. The proposed calibration algorithm, based on the use of two simple waveguide sections, along with the developed mathematical formulation, allows the complete extraction of the relevant SP parameters: return loss, isolation, cross-coupling (XP) or axial ratio (AR), and copolarization losses (CP). The methodology has been successfully validated for two different designs at Ku-band.

Topics & Concepts

PolarizerReturn lossAmplitudeCalibrationWaveguideCharacterization (materials science)OpticsCoupling (piping)Simple (philosophy)Ku bandElectronic engineeringAcousticsPhysicsEngineeringElectrical engineeringMechanical engineeringBirefringenceAntenna (radio)PhilosophyEpistemologyQuantum mechanicsMicrowave Engineering and WaveguidesRadio Frequency Integrated Circuit DesignMicrowave and Dielectric Measurement Techniques