A dynamic time-varying reliability model for linear guides considering wear degradation
Hui Yu, Yan Ran, Genbao Zhang, Guangqi Ying
Topics & Concepts
Reliability (semiconductor)Linear modelMonte Carlo methodStiffnessComputer scienceLinear relationshipReliability engineeringControl theory (sociology)MathematicsEngineeringStructural engineeringStatisticsMachine learningArtificial intelligencePhysicsQuantum mechanicsControl (management)Power (physics)Gear and Bearing Dynamics AnalysisTribology and Lubrication EngineeringAdvanced Measurement and Metrology Techniques