A comprehensive study of electromigration in pure Sn: Effects on crystallinity, microstructure, and electrical property
Yi‐Han Liao, Chang-Hsien Chen, Chien-Lung Liang, Kwang‐Lung Lin, Albert T. Wu
Topics & Concepts
ElectromigrationMaterials scienceCrystallinityLattice constantMicrostructureComposite materialCrystallographyCondensed matter physicsDiffractionOpticsChemistryPhysicsElectronic Packaging and Soldering TechnologiesCopper Interconnects and ReliabilitySemiconductor materials and interfaces